Bruker Dimension Icon Atomic Force Microscope

Location: Room G022, Building 22 of The North Campus Research Complex

Atomic force microscopy (AFM), scanning force microscopy (SFM) is a high-resolution microscopic technique where the microscopic information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric scanners facilitate (in x,y and z directions) tiny, but accurate, movements to enable very precise scanning. With demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit, AFM has become a standard technique for surface analysis of materials.

Some of these applications may require the purchase of special cantilevers, cantilever holders, etc.

• Contact AFM
• Tapping AFM
• Lateral Force AFM
• STM (needs a tip holder)
• Magnetic Force Microscopy
• Veeco's ScanAsyst / PeakForce Tapping
• Fluid Imaging
• Veeco's QNM (nanomechanical mapping)
• Surface Potential / Scanning Kelvin Probe Microscopy
• Phase Imaging
• LiftMode (enables MFM/EFM)
• Force curve and pulling
• Torsional Resonance Mode
• Piezo Response